Automated inspection data collection for machine learning applications
US12278940B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 6, 2023 |
| Grant date | Apr 15, 2025 |
| Priority date | — |
| Expiry date | Oct 6, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/57
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method includes collecting measurement data of a sample, determining a confidence value associated with the measurement data, determining if the confidence value is less than a confidence threshold value, and causing the measurement data to be stored in a memory device if the confidence value is less than the confidence threshold value. The method further includes utilizing the measurement data for training of a machine learning system, thereby updating the operation of the machine learning system. The measurement data is measured by an inspection device located at a first location. In one example, the measurement data is a captured image captured by an optical inspector. The confidence value associated with the captured image represents the confidence of the machine learning system regarding what is displayed in the captured image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.