Method for detecting a defect in a structure of a device
US12281967B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2022 |
| Grant date | Apr 22, 2025 |
| Priority date | — |
| Expiry date | Jul 12, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting a defect in a structure of a device includes generating, only using the device, a low-frequency signal that makes the structure vibrate, generating a high-frequency signal in the structure, and measuring a vibratory signal caused by the generated low-frequency and high-frequency signals at the same time then adaptively re-sampling these measurements to obtain a re-sampled vibratory signal the power spectrum. The resampling includes a first frequency range [uBFmin; uBFmax] of width larger than 5 Hz that contains 95% of the power of the low-frequency signal, a second frequency range [uHFmin; uHFmax] of width systematically smaller than uBFmin that contains 95% of the power of the low-frequency signal. A defect is signaled in the structure if an additional power lobe is detected outside of the ranges [uBFmin; uBFmax] and [uHFmin; uHFmax].
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.