Patent · US Active

System for characterizing a transistor circuit

US12282054B2 · kind B2 · utility

0Cited by
3References
15Claims
0Family size

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Inventors

Key dates

Filing dateNov 2, 2023
Grant dateApr 22, 2025
Priority date
Expiry dateNov 2, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10K10/46
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for characterizing a transistor circuit which has a local minimum in its transfer characteristic by finding its local minimum. The system comprises: a bias voltage generator for generating a toggling signal; a multiplier configured for multiplying an electrical signal which is a function of the drain source current of the transistor circuit, with a waveform alternating between two predefined values synchronously with the toggling signal; a first integrator configured for integrating the electrical signal from the multiplier, and wherein if more integrators are present, linear combinations of output signals of the integrators are provided to the further integrators; a summator configured for summing the toggling signal and an integration signal and configured for outputting the sum to the gate of the transistor circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.