Machine vision method and system
US12282116B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 5, 2019 |
| Grant date | Apr 22, 2025 |
| Priority date | — |
| Expiry date | Apr 3, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H1/0866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical system for automated vision and detection. The system includes a light source configured to emit a beam into an environment and a first diffractive optical element. The beam passes through the first diffractive optical element, resulting in a plurality of beams. One or more of the plurality of beams are reflected by the environment, resulting in reflected beams. A second diffractive optical element of the optical system is configured to receive the reflected beams. A detector in alignment with the second diffractive optical element receives the reflected beams. The detector is configured to determine wave data from the reflected beams and generate a plurality of phasorgrams in a single image representing the wave data. The optical system also includes a processor configured to receive the single image and generate a representation of the environment. A control computer is configured to receive the representation of the environment from the processor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.