Method for analyzing lesion based on medical image
US12283051B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Dec 20, 2021 |
| Grant date | Apr 22, 2025 |
| Priority date | — |
| Expiry date | Jul 15, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/032
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a method for analyzing a lesion based on a medical image, which is performed by a computing device. The method may include: obtaining positional information of a suspicious nodule which exists in the medical image; generating a mask for the suspicious nodule based on a patch of the medical image corresponding to the positional information; and determining a class for a state of the suspicious nodule based on the patch of the medical image and the mask for the suspicious nodule.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.