Blind scan for multi-carriers and multi-technologies and seamless signal analysis
US12284101B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Aug 11, 2022 |
| Grant date | Apr 22, 2025 |
| Priority date | — |
| Expiry date | Aug 12, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/18
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the technologies. The test device launches, responsive to detecting a channel from the blind scan, a signal analysis or a spectrum analysis application for the channel according to a carrier frequency and a technology identified for the channel by the blind scan.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.