Patent · US Active

Device and method for online measuring spectrum for laser device

US12287241B2 · kind B2 · utility

0Cited by

2References

8Claims

0Family size

Assignee

Beijing RSLaser Opto-Electroncis Technology Co., Ltd. · CN

Inventors

Guangyi Liu · San Jose, US
Rui Jiang · Beijing, CN
Xiaoquan Han · Beijing, CN
Jiangshan Zhao · Beijing, CN
Pengfei Sha · Beijing, CN
Qingqing Yin · Beijing, CN
Hua Zhang · Hangzhou City, CN
Xinyue Hu · Beijing, CN

Key dates

Filing date	Dec 16, 2020
Grant date	Apr 29, 2025
Priority date	—
Expiry date	Mar 7, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01J2003/451
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided are a device (4) and a method for online measuring a spectrum for a laser device. The device (4) for online measuring a spectrum for a laser device includes: a first optical path assembly (G1) and a second optical path assembly (G2), and the second optical path assembly (G2) and the first optical path assembly (G1) constitute a measurement optical path. The second optical path assembly (G2) includes: an FP etalon (15) and a grating (18). The homogenized laser beam passes through the FP etalon (15) to generate an interference fringe. The grating (18) is arranged after the FP etalon (15), or is arranged before the FP etalon (15) in the measurement optical path, and is configured to disperse the laser beam passing through the FP etalon (15).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.