Patent · US Active

Pore measurement device

US12287287B2 · kind B2 · utility

0Cited by

1References

19Claims

0Family size

Assignee

The Regents of the University of California · US

Inventors

Niall O'Dowd · Chicago, US
Michael Edward Todd · Simi Valley, US

Key dates

Filing date	Nov 12, 2020
Grant date	Apr 29, 2025
Priority date	—
Expiry date	Jul 18, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/8829
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In one aspect, there is provided a system including at least one processor, and at least one memory including program code which when executed by the at least one processor causes operations including capturing an image of at least a portion of a surface of an object; generating, from the captured image, pixel intensity data; in response to generating the pixel intensity data, determining, based on a height error model, height error data, wherein the height error data indicates an uncertainty of at least one height measurement of the object; and determining, based on the height error data, whether the object satisfies a threshold criteria for acceptance of the object. Related system, methods, and articles of manufacture are also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.