Sample analysis with mirrors
US12287350B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2019 |
| Grant date | Apr 29, 2025 |
| Priority date | — |
| Expiry date | Apr 25, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/1727
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device is disclosed, including: a plate including a sample deposition tube adapted to receive a sample comprising one or more analytes, the sample deposition tube defining a vertical axis substantially perpendicular to a main surface of the plate; and a mirror positioned to project, substantially parallel to the main surface of the plate, an image of the sample deposition tube along its vertical axis, so as to allow determination of the vertical location of the one or more analytes inside the sample deposition tube. Methods for determining the density of one or more analytes using various embodiments of the device are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.