Asynchronous in-system testing for autonomous systems and applications

US12291219B2 · kind B2 · utility

Assignee

• NVIDIA Corporation · US

Inventors

• Anitha Kalva · San Jose, US
• Jae Wu · Santa Clara, US
• Shantanu Sarangi · Santa Clara, US
• Sailendra Chadalavada · Saratoga, US
• Milind Sonawane · San Jose, US
• Chen Fang · Shanghai, CN
• Abilash Nerallapally · Newark, US

Key dates

• Filing date: Oct 24, 2022
• Grant date: May 6, 2025
• Expiry date: Sep 16, 2043

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/3698
• WIPO field: Transport
• WIPO sector: Mechanical engineering

Abstract

Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.