High temperature near-field probe for sensing and energy harvesting applications based upon thermal emission
US12292327B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 17, 2024 |
| Grant date | May 6, 2025 |
| Priority date | — |
| Expiry date | May 17, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/262
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A near-field probe (and associated method) compatible with near-infrared electromagnetic radiation and high temperature applications above 300° C. (or 500° C. in some applications) includes an optical waveguide and a photonic thermal emitting structure comprising a near-field thermally emissive material coupled to or part of the optical waveguide. The photonic thermal emitting structure is structured and configured to emit near-field energy responsive to at least one environmental parameter of interest, and the near-field probe is structured and configured to enable extraction of the near-field energy to a far-field by coupling the near-field energy into one or more guided modes of the optical waveguide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.