Patent · US Active

Circuit, semiconductor device and method for parameter PSRR measurement

US12292483B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 23, 2023
Grant dateMay 6, 2025
Priority date
Expiry dateNov 23, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05F1/56
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A circuit for parameter PSRR measurement includes a filter, a first regulator and a second regulator. The filter may be configured for receiving an AC input signal and a DC input signal, and for outputting a combined output signal according to the AC input signal and the DC input signal. The first regulator may be configured for receiving the combined output signal, and for outputting a first output signal having a first AC component signal and a first DC component signal. The second regulator may be configured for receiving the first output signal, and for outputting a second output signal having a second AC component signal and a second DC component signal. A parameter PSRR of the second regulator may be obtained according to a ratio between the second AC component signal and the first AC component signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.