Patent · US Active

Mn—Ta—W—Cu—O-based sputtering target, and production method therefor

US12293906B2 · kind B2 · utility

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8Claims
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Key dates

Filing dateSep 9, 2019
Grant dateMay 6, 2025
Priority date
Expiry dateSep 29, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11B2007/2432
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

Provided is a Mn—Ta—W—Cu—O-based sputtering target including, in the component composition, Mn, Ta, W, Cu, and O. The sputtering target has a relative density of at least 90%, and includes a crystal phase of Mn4Ta2O9. Also provided is a production method for the sputtering target.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.