Multi-view luminance measuring device and method for measuring multi-view luminance
US12298185B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 19, 2024 |
| Grant date | May 13, 2025 |
| Priority date | — |
| Expiry date | Jan 19, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N13/351
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A multi-view luminance measuring device includes: a base substrate having a long side extending in a first direction and a short side extending in a second direction, wherein the long side is curved with a first curvature; a plurality of lenses positioned on an inner surface of the base substrate; and a plurality of optical sensors positioned on the base substrate to respectively correspond to the plurality of lenses, wherein the first curvature is set such that a distance between each of the plurality of lenses and a target point is constant, and wherein a length of the long side of the base substrate is set to cover a viewing angle with reference to the target point.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.