Two-level paralleliztion of goodness-of-fit tests for spatial process models
US12299360B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 26, 2021 |
| Grant date | May 13, 2025 |
| Priority date | — |
| Expiry date | Sep 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus includes processor(s) to: receive a request to test goodness-of-fit of a spatial process model; generate a KD tree from observed spatial point dataset including locations within a region at which instances of an event occurred; derive, from the observed spatial point dataset, multiple quadrats into which the region is divided; receive, from multiple processors, current levels of availability of processing resources including quantities of currently available execution threads; select, based on the quantity of currently available execution threads, a subset of the multiple processors to perform multiple iterations of a portion of the test in parallel; provide, to each processor of the subset, the KD tree, the spatial process model, and the multiple quadrats; receive, from each processor of the subset, per-quadrat data portions indicative of results of an iteration; derive a goodness-of-fit statistic from the per-quadrat data portions; and transmit an indication of goodness-of-fit to another device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.