Expert-optimal correlation: contamination factor identification for unsupervised anomaly detection
US12299553B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 6, 2022 |
| Grant date | May 13, 2025 |
| Priority date | — |
| Expiry date | Nov 28, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a computer, each of multiple anomaly detectors infers an anomaly score for each of many tuples. For each tuple, a synthetic label is generated that indicates for each anomaly detector: the anomaly detector, the anomaly score inferred by the anomaly detector for the tuple and, for each of multiple contamination factors, the contamination factor and, based on the contamination factor, a binary class of the anomaly score. For each particular anomaly detector excluding a best anomaly detector, a similarity score is measured for each contamination factor. The similarity score indicates how similar, between the particular anomaly detector and the best anomaly detector, are the binary classes of labels with that contamination factor. For each contamination factor, a combined similarity score is calculated based on the similarity scores for the contamination factor. Based on a contamination factor that has the highest combined similarity score, the computer detects that an additional anomaly detector is inaccurate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.