Reliability for machine-learning based image generation
US12299854B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 12, 2022 |
| Grant date | May 13, 2025 |
| Priority date | — |
| Expiry date | Aug 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20216
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method includes using a machine-learning model to determine multiple sets of image data, each representing an estimated solution to an inverse problem associated with multiple waveform return measurements. First image data are based on a first set of waveform return measurements and first model parameters of the machine-learning model, and second image data are based on a second set of waveform return measurements and a second model parameters of the machine-learning model. The method also includes determining, based on the multiple sets of image data, a representative image. The method further includes generating output data that identifies a first area of the representative image as less reliable than a second area of the representative image based on a statistical evaluation of two or more sets of image data of the multiple sets of image data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.