Deep learning model for auto-focusing microscope systems
US12301990B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Aug 6, 2021 |
| Grant date | May 13, 2025 |
| Priority date | — |
| Expiry date | Nov 27, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A computing system receives, from an image sensor, at least two images of a specimen positioned on a specimen stage of a microscope system. The computing system provides the at least two images to an autofocus model for detecting at least one distances to a focal plane of the specimen. The computing system identifies, via the autofocus model, the at least one distance to the focal plane of the specimen. Based on the identifying, the computing system automatically adjusts a position of the specimen stage with respect to an objective lens of the microscope system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.