Systems and methods for calibrating deformable sensors
US12304088B2 · kind B2 · utility
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31References
14Claims
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Key dates
| Filing date | May 6, 2021 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Jan 25, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for calibrating deformable sensors are disclosed. In one embodiment, a method of calibrating a deformable sensor includes capturing image data of the deformable sensor using an external image sensor, wherein the deformable sensor comprises a deformable membrane defining an enclosure that is configured to be filled with a medium. The method further includes comparing the image data of the deformable sensor to a metric. When the image data does not satisfy the metric, the method includes adjusting a pressure within the enclosure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.