Measurement system and method for obtaining information about a sample
US12306100B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 9, 2022 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Dec 5, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0636
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system for obtaining information about a sample comprises an excitation-beam source configured for irradiating the sample with an excitation-beam. The measurement system comprises a probe unit configured for exposing the sample to a probing radiation or a probing field, and a detection unit configured for obtaining a first information about an interaction of the probing radiation or the probing field with the sample, if a plasmon or plasmon-polariton was excited by the excitation-beam, and obtaining a second information about an interaction of the probing radiation of the probing field with the sample, if a plasmon or plasmon-polariton was not excited by the excitation-beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.