Power amplifiers testing system and related testing method
US12306263B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Jan 11, 2024 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Jan 11, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F2203/45621
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A testing system includes: a dividing circuit configured to receive a testing signal and provide a plurality of input signals according to the testing signal; and a plurality of integrated power-amplifiers coupled to the dividing circuit, each of the plurality of integrated power-amplifiers being configured to be tested by receiving a respective input signal of the plurality of input signals and generating a respective output signal for a predetermined testing time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.