Surface defect detection method, system, equipment, and terminal thereof
US12307653B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2024 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Dec 2, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosure discloses a surface defect detection method, system, equipment, and terminal, comprising: S1, LBP operator: before comparing the benchmark image with the actual shot image, a LBP texture feature extraction algorithm is first used for pre-processing; S2, Sift feature-point matching: adding a Sift feature-point matching algorithm to calculate key feature points in the image and compare; S3, defect detection: when the local feature points of the shot image are successfully matching with a certain image in the benchmark image library, a detailed comparison will be made and complete defect detection. The disclosure integrates various image processing methods in advance without any setting by users. After running the system with one click, it can automatically perform detection, greatly reducing personnel training costs. The disclosure has simple structure and low cost. The basic structure only needs a computer, camera, and light source, making it easy to use and with highly mobile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.