Parameter calibration method and apparatus
US12307715B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2022 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Jul 11, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/73
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This application provides a parameter calibration method and apparatus, which may be applied to calibration of an intrinsic parameter and an extrinsic parameter of an image shooting device. According to the method and apparatus, with a position of a calibration pattern fixed, a position and an angle of the image shooting device relative to the calibration pattern are accurately adjusted by changing a pose parameter of the image shooting device, so that the image shooting device photographs the calibration pattern at each given position and angle relative to the calibration pattern, to obtain at least one shooting result. The shooting result can correspond to coordinate in a pixel coordinate system and a world coordinate system, so that accuracy of an intrinsic parameter and an extrinsic parameter is correspondingly calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.