Material spectroscopy
US12307814B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2023 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Dec 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A computer, including a processor and a memory, the memory including instructions to be executed by the processor to acquire a first image by illuminating a first object with a first light beam, segment the first image of the first object to determine regions that correspond to a first surface material and determine a first measure of pixel values in regions of the first image that correspond to the first surface material. The instructions include further instructions to perform a comparison of the first measure of pixel values to a second measure of pixel values determined from a second image of a second object, wherein the second image is previously acquired by illuminating the second object with a second light beam and when the comparison determines that the first measure is equal to the second measure of pixel values within a tolerance, determine that the first object and the second object are a same object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.