Subspace approach to accelerate Fourier transform mass spectrometry imaging
US12308222B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2022 |
| Grant date | May 20, 2025 |
| Priority date | — |
| Expiry date | Jun 16, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20212
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Methods, apparatus, and storage medium for obtaining high-resolution mass spectra and chemical maps from a sample using a subspace Fourier transform mass spectrometry (FT-MS) approach are described. The method includes conducting a first set of image data corresponding to a first group of spatial positions on the sample and a second set of image data corresponding to a second group of spatial positions on the sample; conducting a decomposition process on the first set of image data to obtain a set of basis elements; performing a reconstruction process on a second set of image data to obtain a set of reconstructed image data; performing a Fourier transform on the first and second sets of image data to obtain a first and second sets of mass spectra, respectively; and obtaining a FT-MS image for the sample based on the first set of mass spectra and the second set of mass spectra.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.