Patent · US Active

Method for manufacturing semiconductor structure, semiconductor structure, and semiconductor memory

US12310247B2 · kind B2 · utility

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4References
15Claims
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Key dates

Filing dateJun 17, 2022
Grant dateMay 20, 2025
Priority date
Expiry dateOct 20, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N50/80

Abstract

A method for manufacturing a semiconductor structure, a semiconductor structure and a semiconductor memory are provided. The method includes: providing a substrate; forming an MTJ structure and a first mask structure sequentially on the substrate; patterning the first mask structure to form a first pattern extending in a first direction; forming a second mask structure on the first pattern; patterning the second mask structure to form a second pattern extending in a second direction, in which the first direction intersects the second direction, and is not perpendicular to the second direction; patterning the first pattern by utilizing the second pattern to form a cellular pattern; and transferring the cellular pattern to the MTJ structure to form a cellular MTJ array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.