X-ray inspection apparatus and X-ray inspection method
US12313572B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 13, 2021 |
| Grant date | May 27, 2025 |
| Priority date | — |
| Expiry date | Mar 8, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/646
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection apparatus includes an X-ray generator; an X-ray detector; and a determination unit determining a quality state of an inspection object, based on an X-ray detection signal. The apparatus has an X-ray image storing unit storing a first inspection image, corresponding to the X-ray detection signal outputted from the X-ray detector, whose observation direction is the direction in which the X-rays transmits the inspection object; a pseudo three-dimensional information generation model generating pseudo three-dimensional information regarding a type of object to be learned; and an inspection image generation unit creating a second inspection image regarding the type of object to be learned having an observation direction different from the first inspection image, based on the first inspection image regarding the type of object to be learned. The determination unit performs the determination based on at least the second inspection image created by the inspection image generation unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.