Probe joint and spring probe comprising the same
US12313651B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 6, 2023 |
| Grant date | May 27, 2025 |
| Priority date | — |
| Expiry date | Feb 16, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/073
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are a probe joint including a micro-electromechanical probe head and a conductive member, and a spring probe including the same. The probe head includes a docking portion extending in a radial direction to form a deformable portion; and a contact portion for contacting an object to be tested, which is located at one end of the docking portion and has a size decreasing as away from the docking portion. The conductive member has a connecting section having an extended portion surrounding to define a carrier space; and a notch which communicates with the carrier space. When assembling, the docking portion can be disposed in the carrier space, the deformable portion extends out of the connecting section through the notch. The deformable portion can be deformed and forms a deformed portion, which partially wraps the extended portion, thereby preventing the probe head from being separated from the conductive member.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.