Pressurizing device for semiconductor testing and semiconductor test device including the same
US12313677B2 · kind B2 · utility
0Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2022 |
| Grant date | May 27, 2025 |
| Priority date | — |
| Expiry date | Jan 7, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2891
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pressurizing device for semiconductor testing includes a tension block, a first pusher block extending through the tension block, a base plate on the first pusher block, a second pusher block on the tension block and extending through the base plate, a first spring connected to each of the first pusher block and the second pusher block, a second spring connected to each of the tension block and the base plate, a press plate on the base plate, and a press shaft coupled to the press plate. The press shaft includes a shaft hole.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.