Devices, systems, and methods for anomaly detection
US12315176B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 13, 2022 |
| Grant date | May 27, 2025 |
| Priority date | — |
| Expiry date | Aug 21, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20224
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Some devices, systems, and methods obtain training images; select a first reference image and a second reference image from the training images; generate a first set of aligned training images, wherein generating the first set of aligned training images includes aligning the training images to the first reference image; generate a first anomaly-detection model based on the first set of aligned training images; generate a second set of aligned training images, wherein generating the second set of aligned training images includes aligning the training images to the second reference image; and generate a second anomaly-detection model based on the second set of aligned training images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.