Method and apparatus with recognition model training
US12315228B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2022 |
| Grant date | May 27, 2025 |
| Priority date | — |
| Expiry date | Nov 25, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/82
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A processor-implemented method includes: generating a first sample image and a second sample image by performing data augmentation on an input training image; generating a first feature map of the first sample image and a second feature map of the second sample image by performing feature extraction on the first sample image and the second sample image using an encoding model; determining first loss data according to a relationship between first feature vectors of the first feature map and second feature vectors of the second feature map; estimating relative geometric information of the first feature map and the second feature map using a relationship estimation model; determining second loss data according to the relative geometric information, based on label data according to a geometric arrangement of the first sample image and the second sample image in the input training image; and training the encoding model and the relationship estimation model, based on the first loss data and the second loss data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.