Method for generating industrial defect image, device, medium, and product
US12315232B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2025 |
| Grant date | May 27, 2025 |
| Priority date | — |
| Expiry date | Jan 18, 2045 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for generating an industrial defect image, a device, a medium, and a product are provided, relating to the field of image processing. The method includes: acquiring an industrial defect-free image; and generating an industrial defect image based on the industrial defect-free image by using a defect image generation model. The defect image generation model is constructed based on a cyclic Generative Adversarial Network (GAN); the defect image generation model includes two generators and two discriminators, with each generator including an encoder, a transformer, and a decoder connected in sequence; the encoder uses convolution operations to extract features from an input image, the transformer uses a self-attention-based residual network to transform an image output by the encoder, and the decoder uses a skip connection mechanism and deconvolution operations to decode an image output by the transformer to obtain a generated image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.