X-ray lead marker detection system for x-ray imaging system
US12318239B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2022 |
| Grant date | Jun 3, 2025 |
| Priority date | — |
| Expiry date | Oct 4, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H50/20
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An artificial intelligence (AI) lead marker detection system is employed either as a component of the X-ray imaging system or separately from the X-ray imaging system to scan post-exposure X-ray images to detect and insert various lead markers, to digitize information provided by the type and location of the lead marker, and to employ the marker information in different X-ray system workflow automations. The marker information obtained by the AI lead marker detection system can also provide useful data for use in downstream clinical and quality applications apart from the X-ray system, such as either AI or non-AI analytical applications.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.