Detector wavelength calibration
US12320699B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2020 |
| Grant date | Jun 3, 2025 |
| Priority date | — |
| Expiry date | Aug 2, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of calibrating a driving parameter of an optical component across an operating wavelength range of the component. The method comprises placing a layer of material in a light path, the layer of material being substantially planar and substantially transparent and having a thickness of the order of wavelengths in said range and operating said component to vary said driving parameter whilst detecting light transmitted through said layer of material to obtain driving parameter versus light intensity data. The obtained data is then compared with characterizing data previously derived for said layer of material in order to calibrate said driving parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.