Method of determining crystallinity and method of manufacturing a display device using the same
US12324345B2 · kind B2 · utility
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4References
21Claims
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Key dates
| Filing date | Apr 27, 2022 |
| Grant date | Jun 3, 2025 |
| Priority date | — |
| Expiry date | Jun 29, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K59/1201
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining crystallinity may include acquiring a Raman spectrum of each of samples that are crystallized, determining a first sample that exhibits a first Raman spectrum having a first Raman intensity that is largest among the Raman spectra, as an optimal sample, and determining a second sample that exhibits a second Raman spectrum having a second Raman intensity that is within a range from the first Raman intensity based on the first Raman intensity, as a first normal sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.