Identifying glitches and levels in mixed-signal waveforms

US12326466B2 · kind B2 · utility

Assignees

• THE INDIAN INSTITUTE OF TECHNOLOGY KHARAGPUR · IN
• TEXAS INSTRUMENTS INCORPORATED · US

Inventors

• Sayandeep Sanyal · Kharajpur, IN
• Pallab Dasgupta · Rajpura, IN
• Aritra Hazra · Kharajpur, IN
• Scott M. Morrison · Lino Lakes, US
• Sudhakar Surendran · Bengaluru, IN
• Lakshmanan Balasubramanian · Survanagiri, IN

Key dates

• Filing date: Nov 30, 2022
• Grant date: Jun 10, 2025
• Expiry date: Dec 24, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R29/00
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Various embodiments disclosed herein provide for a glitch detection and level detection method that use information contained in the signal itself to determine at which resolution or granularity the glitch detection and level detection operates. In particular, the glitch detection method comprises defining a glitch in terms of a change in the area under the waveform which can serve to disambiguate glitches from noises and other transient side effects of level transmissions. Likewise, the level detection method uses an entropy-based metric to identify levels that are significant in context of the entire signal and not in absolute terms.