Deep learning based single frame super resolution microscopy image processing
US12327327B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2022 |
| Grant date | Jun 10, 2025 |
| Priority date | — |
| Expiry date | Sep 23, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10064
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present application provides methods, devices, systems and non-transitory computer readable storage media for image processing. In an aspect, there is provided a computer-implemented method of image processing, the method comprising: receiving a low resolution image of an object; generating an edge map of the low resolution image by an edge extractor; and inputting the edge map and the low resolution image to a neural network to reconstruct a super resolution image of the object, wherein the neural network is trained using a multicomponent loss function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.