Patent · US Active

Deep learning based single frame super resolution microscopy image processing

US12327327B2 · kind B2 · utility

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18Claims
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Key dates

Filing dateAug 29, 2022
Grant dateJun 10, 2025
Priority date
Expiry dateSep 23, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/10064
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present application provides methods, devices, systems and non-transitory computer readable storage media for image processing. In an aspect, there is provided a computer-implemented method of image processing, the method comprising: receiving a low resolution image of an object; generating an edge map of the low resolution image by an edge extractor; and inputting the edge map and the low resolution image to a neural network to reconstruct a super resolution image of the object, wherein the neural network is trained using a multicomponent loss function.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.