Method and electronic device for removing artifact in high resolution image
US12327340B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2022 |
| Grant date | Jun 10, 2025 |
| Priority date | — |
| Expiry date | Dec 4, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30242
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for removing an artifact in a high resolution image by an electronic device is provided. The method includes receiving the high resolution image comprising the artifact. Further, the method includes downscaling the high resolution image into a plurality of lower resolution images. Further, the method includes removing the artifact from the plurality of lower resolution images by applying at least one first machine learning model from a plurality of machine learning models on the plurality of lower resolution images. Further, the method includes generating a high resolution image free from the artifact by applying at least one second machine learning model from the plurality of machine learning models on an output from the at least one first machine learning model. The output from each of the machine learning model comprises a low resolution image free from the artifact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.