Systems and methods for analyzing samples
US12327717B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Oct 20, 2022 |
| Grant date | Jun 10, 2025 |
| Priority date | — |
| Expiry date | Dec 13, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/063
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output a plurality of particles, a tube having a central axis, and a skimmer. In some embodiments, the skimmer may include an aperture arranged to receive the one or more charged particles deflected by a deflector and a contact surface comprising an intersection point that intersects the central axis of the tube. The intersection point may be spaced from the aperture by a distance of at least 5 mm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.