System and method for continuous calibration of X-ray scans
US12329563B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 2020 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Apr 30, 2041 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/585
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A dual-energy X-ray absorptiometry (“DXA”) system includes an x-ray source assembly comprising a source carriage to move the x-ray source assembly along a scan path, the scan path comprising an active scan portion and a reference measurement portion. A detector assembly including a detector carriage to move the detector assembly with the source assembly and to collect scan data at active scan portions. A support structure supporting the source and detector assemblies. A calibration controller coupled a calibration element having a known x-ray attenuation value and configured position the calibration element between the source and detector assemblies during the reference measurement portion and to remove the calibration element from between the source and detector assemblies during the active scan portion. A processing unit operable to compare the reference measurement against an expected reference value to identify a variance and to selectively trigger an action in response to the variance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.