Dual lens inspection device
US12332181B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 10, 2023 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Jan 10, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0668
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual lens inspection device, having a low power lens group satisfies the condition value of 3.0≥magnification≥1.0; a high power lens group, satisfies the condition value of 25.0≥magnification≥15.0; a light source module projecting an illumination light source to the low power lens group and the high power lens group; a beam splitter arranged on the optical path of the illumination light source, so as to generate a first optical path passing through the low power lens group and a second optical path passing through the high power lens group, and projected on an object located on the same plane; a first luminous flux module and a second luminous flux module control the luminous flux of the first and second optical path, and then achieve the effect of dark field illumination; a camera using the beam splitter to achieve a beam steering effect, and then captures the image of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.