X-ray inspection system, an x-ray imaging accessory, a sample support, a kit, and a method of using an x-ray inspection system
US12332189B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2021 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Sep 12, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/3306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray inspection system comprising an x-ray source, an x-ray detector, a sample support comprising a pliable material and a sample support positioning assembly configured to position the sample support between the x-ray source and the x-ray detector. The sample support is configured to removably clamp a sample for inspection in a fixed position with respect to the sample support and configured so that, in use, at least one surface of the sample is in contact with the pliable material. The sample support positioning assembly comprises a rotational drive configured to rotate the sample support about a rotational axis. This allows the sample to be rotated about a rotational axis such that a series of two-dimensional images can be captured by the x-ray detector that can be used to create a three-dimensional reconstruction of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.