Removing test equipment noise from power spectral density measurements
US12332299B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 5, 2023 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Sep 11, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2841
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.