Metric management in multi-computing cluster environment
US12332761B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 20, 2024 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Feb 20, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L67/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Metric management techniques in a multi-cluster computing environment are disclosed. For example, a method obtains a set of metrics collected from one or more computing clusters of a distributed computing environment, wherein the set of metrics are associated with one or more processes that are executable on the one or more computing clusters. The method computes one or more metric importance values for the set of metrics based on one or more processing criteria. The method sends the one or more metric importance values to at least one computing cluster of the one or more computing clusters to enable the at least one computing cluster to adapt a collection frequency of at least one metric of the set of metrics. Such adaptation, by way of example, can be based on the metric importance and resource availability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.