Machine-learned model for duplicate crash dump detection
US12333448B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 1, 2021 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Jan 4, 2044 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In an example embodiment, a machine learned model is utilized for identifying duplicate crash dumps. After a developer submits code, corresponding test cases are used to ensure the quality of the software delivery. Test failures can occur during this period, such as crashes, errors, and timeouts. Since it takes time for developers to resolve them, many duplicate failures can occur during this time period. In some embodiments, trash triggering is the most time-consuming task of development, and thus if duplicate crash failures can be automatically identified, the degree of automation will be significantly enhanced. To locate such duplicates, a training-based machine learned model uses component information of an in-memory database system to achieve better crash similarity comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.