Electronic device for detecting defect in image on basis of difference among sub-images acquired by multiple photodiode sensors, and operation method thereof
US12333696B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 11, 2022 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Nov 1, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10144
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An electronic device is provided. The electronic device includes a memory, an image sensor including light receiving elements each including at least two sub light receiving elements, and an image signal processor. The image signal processor is configured to obtain images corresponding to light from outside by using the image sensor, the images including at least a raw image, a first sub image, and a second sub image, the first sub image being an image corresponding to light detected by at least one first sub light, the second sub image being an image corresponding to light detected by at least one second sub light, identify a luminance ratio between the first sub image and the second sub image, identify a defect in the raw image, based on the luminance ratio, and perform a function corresponding to a type of the defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.