Method and apparatus for analyzing a product, training method, system, computer program, and computer-readable storage medium

US12333705B2 · kind B2 · utility

Assignee

• Fujitsu Technology Solutions GmbH · DE

Inventors

• Felix Rothmund · Munich, DE
• Simran Agarwal · Munich, DE
• Leslie Casas · Munich, DE
• Keng Chai · Munich, DE
• Markus Bößl · Munich, DE
• Shweta Mahajan · Delhi, IN
• Jonathan Pirnay · Munich, DE
• Jochen Riedisser · Augsburg, DE

Key dates

• Filing date: Jul 19, 2022
• Grant date: Jun 17, 2025
• Expiry date: Jul 21, 2043

Classification

• Technology area (CPC G): Physics
• CPC primary: G06V2201/06
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A method of analyzing a product includes performing an anomaly detection on a received image using an autoencoder, wherein the autoencoder includes at least one first neural network trained based on a first set of training images, and the first set of training images includes a plurality of training images each showing a corresponding defect-free product; determining, using a binary classifier, whether or not a defect is present based on a result of the anomaly detection; performing defect detection on the received image using a defect detector, wherein the defect detector includes a third neural network trained based on a one third set of training images, and the third set of training images includes a plurality of training images each showing a corresponding defective product; and evaluating a result based on a weighting of the results of the anomaly detection, the defect detection, and the binary classifier.