Guided workflow for deep learning error analysis
US12333792B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2022 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Jul 8, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/945
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A model management system performs error analysis on results predicted by a machine learning model. The model management system identifies an incorrectly classified image outputted from a machine learning model and identifies using the Neural Template Matching (NTM) algorithm, an additional image correlated to the selected image. The system outputs correlated images based on a given image and a selection by a user through a user interface of a region of interest (ROI) of the given image. The region is defined by a bounding polygon input and the correlated images include features correlated to the features within the ROI. The system prompts a task associated with the additional image. The system receives a response that includes an indication that the additional image is incorrectly labeled and including a replacement label and instruct that the machine learning model be retrained using an updated training dataset that includes the replacement label.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.