Machine function analysis with radar plot
US12333864B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2023 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Dec 15, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07C3/08
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A system and method for detecting abnormal operating conditions in a machine through the analysis and comparison of radar areas after the transformation of waveform data collected from machine parts. An example embodiment is configured to: generate a monitoring signal in response to the behavior of a machine while the machine is in operation; simultaneously monitor two or more spectrums in the monitoring signal; collect data for two ore more spectrums at times when the machine is operating normally to establish an operational baseline of said machine; identify a respective energy level in each of the two or more spectrums; process waveform data corresponding to each of said identified energy levels into a Fast Fourier Transform radar plot; determine an area that corresponds to the FFT radar plot; correlate changes in the area of the FFT radar plot with changes in spectrum data and changes in the operation of the machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.