Device and method for measuring semiconductor-based light sources

US12339162B2 · kind B2 · utility

Assignee

• Instrument Systems GmbH · CA

Inventors

• Reto Haring · Munich, DE
• Christian Rixner · Tegernsee, DE
• Florian Schewe · Munich, DE
• Siegbert Sadowski · Irsee, DE
• Angel Gavrailov · Kolbermoor, DE
• Christian Josef Dotzler · Baierbrunn, DE
• Martin Mangstl · Munich, DE

Key dates

• Filing date: Nov 27, 2019
• Grant date: Jun 24, 2025
• Expiry date: Sep 20, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2001/446
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Methods and devices for the sequential measurement of a plurality of semiconductor-based light sources that operate faster, more accurately and more sensitively than known methods and devices. In accordance with one implementation, a current pulse is applied by a pulsed current source to the low-luminosity light sources consecutively or simultaneously. The emitted light pulse of LED is converted into electric charge carriers by a photodiode, the electric charge carries are added up by means an integrator circuit, the added-together charge carriers are converted by an A/D converter into a digital signal and the digital signal is forwarded to a measurement and control unit.